X Ray

NEX CG

 

XRF

Measure almost any element in almost any matrix

X-ray fluorescence (XRF) provides one of the simplest, most accurate and most economic analytical methods for the determination of elemental composition of many types of materials. Indispensable to both R&D and quality assurance (QA) functions. Rigaku offerings range from high power, high-performance wavelength dispersive WDXRF systems, for the most demanding applications, to a complete line of benchtop energy dispersive X-ray fluorescence (EDXRF) and WDXRF systems. For non-destructive ultra-trace elemental analysis.

Wavelength dispersive, Energy Dispersive & Total reflection X-ray fluorescence

 

NEX QC

Low-cost EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-film

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NEX QC+ QuantEZ

NEX QC+ with powerful Windows® software and optional FP

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NEX CG

High-performance, Cartesian-geometry EDXRF elemental analyzer measures Na to U in solids, liquids, powders and thin-films

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NEX DE 

New 60 kV EDXRF system featuring QuantEZ software and optional standardless analysis.

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NEX DE VS 

New variable collimator small spot 60 kV EDXRF system featuring QuantEZ software.

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