X Ray

NEX CG

 

NEX CG

Advanced cartesian geometry EDXRF for rapid qualitative and quantitative elemental analysis

Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards:

  • Analyze 11Na to 92U non-destructively
  • Solids, liquids, powders and thin films
  • Polarized excitation for lower detection limits
  • Novel treatment of peak overlap reduces errors
  • PPB detection limits for aqueous samples using UltraCarry
  • Simplified user interface with EZ Analysis

Polarized cartesian geometry for trace level sensitivity

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.

Novel software reduces the need for standards
NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards.

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NEX QC+NEX QC Plus

Energy Dispersive X-ray Fluorescence Analyzer

New high resolution benchtop EDXRF for rapid qualitative and quantitative elemental analysis
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.

EDXRF for quality control applications
Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive “icon-driven” touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with high precision and broad elemental coverage
The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

EDXRF with autosampler, helium and FP options
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

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NEX QCNEX QC

Energy Dispersive X-ray Fluorescence Analyzer

New low cost benchtop EDXRF for rapid qualitative and quantitative elemental analysis
Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types:

  • Analyze 11Na to 92U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • Semiconductor detector for superior data quality
  • Modern smartphone style “icon driven” user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Optional fundamental parameters

Superior EDXRF capabilities with ease-of-use
As a premium low cost benchtop X-ray Fluorescence (XRF) analyzer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications.

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